material

SiNi
ID:

mp-999192
DOI:

10.17188/1317501

Tags: Nickel silicide (1/1)

Material Details

Final Magnetic Moment
0.000 μB

Calculated total magnetic moment for the unit cell within the magnetic ordering provided (see below). Typically accurate to the second digit.
Magnetic Ordering
NM
Formation Energy / Atom
-0.454 eV

Calculated formation energy from the elements normalized to per atom in the unit cell.

Energy Above Hull / Atom
0.047 eV

The energy of decomposition of this material into the set of most stable materials at this chemical composition, in eV/atom. Stability is tested against all potential chemical combinations that result in the material's composition. For example, a Co2O3 structure would be tested for decomposition against other Co2O3 structures, against Co and O2 mixtures, and against CoO and O2 mixtures.

Density
6.18 g/cm3

The calculated bulk crystalline density, typically underestimated due calculated cell volumes overestimated on average by 3% (+/- 6%)

Decomposes To
SiNi
Band Gap
0.000 eV

In general, band gaps computed with common exchange-correlation functionals such as the LDA and GGA are severely underestimated. Typically the disagreement is reported to be ~50% in the literature. Some internal testing by the Materials Project supports these statements; typically, we find that band gaps are underestimated by ~40%. We additionally find that several known insulators are predicted to be metallic.

Space Group

Hermann Mauguin
Pmmn [59]
Hall
P 2 2ab 1ab
Point Group
mmm
Crystal System
orthorhombic

Electronic Structure

Topological data for ICSD ID 187622 from Topological Materials Database
Topological Classification
TI*
Subclassification
NLC†
* Topological insulator
† No Linear Combination of Elementary Band Representations

Band Structure and Density of States

Warning! Semi-local DFT tends to severely underestimate bandgaps. Please see the wiki for more info.

X-Ray Diffraction

    Select radiation source:
  • Cu
  • Ag
  • Mo
  • Fe

Calculated powder diffraction pattern; note that peak spacings may be affected due to inaccuracies in calculated cell volume, which is typically overestimated on average by 3% (+/- 6%)

X-Ray Absorption Spectra

FEFF XANES

Select an element to display a spectrum averaged over all sites of that element in the structure.

Apply Gaussian smoothing:

0 eV
3 eV
FWHM: 0 eV

Download spectra for every symmetrically equivalent absorption site in the structure.

Download FEFF Input parameters.

Warning: These results are intended to be semi-quantitative in that corrections, such as edge shifts and Debye-Waller damping, have not been included.

Substrates

Reference for minimal coincident interface area (MCIA) and elastic energy:
substrate orientation:
No elastic tensor calculated for this material, so elastic energies not avaialable. Sorting by MCIA instead.
substrate material substrate orientation film orientation MCIA† [Å2]
LaAlO3 (mp-2920) <0 0 1> <1 1 0> 126.0
LaAlO3 (mp-2920) <1 0 0> <1 0 0> 216.0
LaAlO3 (mp-2920) <1 1 1> <1 0 0> 123.4
LaAlO3 (mp-2920) <1 1 0> <1 0 0> 123.4
AlN (mp-661) <1 0 0> <0 1 1> 104.1
AlN (mp-661) <1 0 1> <1 0 0> 138.9
AlN (mp-661) <0 0 1> <1 0 1> 110.0
AlN (mp-661) <1 1 0> <0 1 0> 156.8
AlN (mp-661) <1 1 1> <1 0 0> 108.0
CeO2 (mp-20194) <1 0 0> <1 0 1> 91.6
CeO2 (mp-20194) <1 1 0> <1 0 0> 123.4
CeO2 (mp-20194) <1 1 1> <0 0 1> 207.6
GaAs (mp-2534) <1 0 0> <1 0 1> 128.3
GaAs (mp-2534) <1 1 0> <1 0 1> 91.6
GaAs (mp-2534) <1 1 1> <1 0 0> 231.5
BaF2 (mp-1029) <1 1 0> <1 1 0> 168.0
BaF2 (mp-1029) <1 0 0> <0 0 1> 326.2
BaF2 (mp-1029) <1 1 1> <1 1 0> 210.1
GaN (mp-804) <0 0 1> <1 0 1> 18.3
GaN (mp-804) <1 0 0> <0 0 1> 69.2
GaN (mp-804) <1 0 1> <1 0 0> 77.2
GaN (mp-804) <1 1 0> <0 1 1> 121.4
GaN (mp-804) <1 1 1> <0 0 1> 187.8
SiO2 (mp-6930) <0 0 1> <1 0 1> 128.3
SiO2 (mp-6930) <1 0 0> <1 0 1> 55.0
SiO2 (mp-6930) <1 0 1> <0 1 0> 71.3
SiO2 (mp-6930) <1 1 0> <0 1 0> 99.8
SiO2 (mp-6930) <1 1 1> <0 0 1> 158.2
KCl (mp-23193) <1 0 0> <1 0 0> 123.4
KCl (mp-23193) <1 1 0> <0 0 1> 59.3
KCl (mp-23193) <1 1 1> <1 1 0> 210.1
DyScO3 (mp-31120) <0 1 1> <1 0 1> 55.0
DyScO3 (mp-31120) <1 0 0> <1 0 1> 91.6
DyScO3 (mp-31120) <0 0 1> <1 0 1> 91.6
DyScO3 (mp-31120) <0 1 0> <1 0 1> 91.6
DyScO3 (mp-31120) <1 0 1> <1 0 1> 55.0
DyScO3 (mp-31120) <1 1 0> <0 0 1> 316.3
DyScO3 (mp-31120) <1 1 1> <1 0 0> 138.9
InAs (mp-20305) <1 0 0> <0 1 0> 114.0
InAs (mp-20305) <1 1 0> <0 0 1> 158.2
InAs (mp-20305) <1 1 1> <1 0 1> 128.3
ZnSe (mp-1190) <1 0 0> <1 0 1> 128.3
ZnSe (mp-1190) <1 1 0> <1 0 1> 91.6
ZnSe (mp-1190) <1 1 1> <1 0 0> 231.5
KTaO3 (mp-3614) <1 0 0> <1 0 1> 128.3
KTaO3 (mp-3614) <1 1 0> <0 1 1> 69.4
KTaO3 (mp-3614) <1 1 1> <1 0 1> 55.0
CdS (mp-672) <0 0 1> <1 0 1> 110.0
CdS (mp-672) <1 0 0> <1 0 0> 169.7
CdS (mp-672) <1 0 1> <0 1 0> 128.3
Up to 50 entries displayed.
†minimal coincident interface area.

Elasticity

Reference for tensor and properties:
Visualize with ELATE
Stiffness Tensor Cij (GPa)
217 126 182 0 0 0
126 392 142 0 0 0
182 142 222 0 0 0
0 0 0 115 0 0
0 0 0 0 118 0
0 0 0 0 0 121
Compliance Tensor Sij (10-12Pa-1)
14.9 -0.5 -11.9 0 0 0
-0.5 3.3 -1.7 0 0 0
-11.9 -1.7 15.4 0 0 0
0 0 0 8.7 0 0
0 0 0 0 8.5 0
0 0 0 0 0 8.3
Shear Modulus GV
96 GPa
Bulk Modulus KV
192 GPa
Shear Modulus GR
56 GPa
Bulk Modulus KR
187 GPa
Shear Modulus GVRH
76 GPa
Bulk Modulus KVRH
189 GPa
Elastic Anisotropy
3.60
Poisson's Ratio
0.32

Similar Structures beta feature

Explanation of dissimilarity measure: Documentation.
material dissimilarity Ehull # of elements
InSb (mp-569020) 0.6154 0.138 2
ZrS (mp-7859) 0.6659 0.000 2
CeSe2 (mp-1080340) 0.6733 0.198 2
ZrSn (mp-1094528) 0.7263 0.174 2
MgSb (mp-1094715) 0.6891 0.122 2
Cs (mp-672241) 0.4168 0.065 1
Si (mp-92) 0.7220 0.292 1
Ge (mp-78) 0.7245 0.227 1
Hg (mp-1096992) 0.4012 0.028 1
Sn (mp-84) 0.7232 0.018 1
Up to 5 similar elemental, binary, ternary, quaternary, etc. structures displayed (dissimilarity threshold 0.75). Ehull: energy above hull per atom [eV].

Synthesis Descriptions

10.1002/cssc.201402039
Self-catalytic NiSix nanowires were grown on nickel foam by means of a CVD growth method with SiH4 diluted in H2 as the precursor. First, the nickel foam (99.99% purity) with a diameter of 14mm was [...]
10.1007/s10854-007-9355-9
N type (100) oriented silicon substrates were used to obtain Ni/poly-Si/SiO2 gate stacks. NiSi FUSI gate stacks were fabricated using a modified manufacturing CMOS process flows with thermally growth [...]
chef hat mixing beaker

Explore more synthesis descriptions for materials of composition SiNi.

Text computed by synthesisproject.org.

Calculation Summary

Elasticity

Methodology

Structure Optimization

Run Type
GGA
Energy Cutoff
520 eV
# of K-points
None
U Values
--
Pseudopotentials
VASP PAW: Si Ni_pv
Final Energy/Atom
-6.0559 eV
Corrected Energy
-24.2236 eV
-24.2236 eV = -24.2236 eV (uncorrected energy)

Detailed input parameters and outputs for all calculations

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ICSD IDs
  • 187623
  • 187622
Submitted by
User remarks:
  • Nickel silicide (1/1)

Displaying lattice parameters for primitive cell; note that calculated cell volumes are typically overestimated on average by 3% (+/- 6%). Note the primitive cell may appear less symmetric than the conventional cell representation (see "Structure Type" selector below the 3d structure)